|
Acceleration |
Helium Leak Testing on Components |
|
Atmosphere/Altitude to 80,000 ft. |
HAST Testing |
|
Barometric Pressure
Testing |
Humidity Test |
|
Bond Pull |
Immersion |
|
Burn-in Testing to
+200 Deg C |
Industrial Temperature
Testing |
| Capacitance Testing |
Lead Forming |
|
Centrifuge |
Marking |
|
Class S Testing for
Space |
Non-Destructive
Testing |
|
Clean Room
Microelectronic Packaging |
PIND Particle Impact Noise Detection |
|
Commercial Testing |
Qualification Testing |
|
Cross Sectioning |
Recertification |
|
Custom Hardware/Software |
Reliability Testing |
|
Custom IC & Transistor Packaging |
Power Burn-In |
|
Destructive Testing |
Radiography |
|
Die Qualification |
Resistance to Solvents |
|
Die Shear
Strength Test up to 5.0 Kg |
SEM Analysis - Scanning Electron Microscope |
|
Destructive Physical Analysis - DPA on Components |
Salt Spray |
|
Dust
Testing |
Serialize Components |
|
EDAX |
Shock Testing |
|
Electrical
Characteristics |
Solderability Testing |
Electrical Testing:
- High Voltage
- High Current
|
Space Level Testing |
|
Element Evaluation |
Temperature Cycling (-200°C to +200°C) |
|
Environmental Stress
Screening |
Thermal Shock Testing (+200°C) |
|
Environmental Testing |
Upscreening |
|
Equivalent screening for JAN thru JANS |
Vibration Testing - Up to 500 lb. |
|
Failure Analysis |
Wafer Probing |
|
Fine & Gross Leak Testing |
X-Ray |
|
Fungus Test |
|
| |
|
|
|